• High-temperature Kelvin Probe (HTKP) suitable for:

  - measurement of work function. HTKP is a unique surface sensitive apparatus that may be used for investigation of materials at elevated temperatures and under controlled gas phase environment of atmospheric pressure (it does not require vacuum). See HTKP page

• High-temperature Seebeck Probe (HTSP) suitable for:

  - measurement of thermoelectric power. HTSP is designed to determine the Seebeck coefficient (thermopower) and electrical conductivity of materials (single crystals and polycrystalline specimens) at elevated temperatures (up to 1100°C) and under controlled gas phase environment. See HTSP page

For information regarding

Sialon Ceramics Pty Ltd

Mr. Ross K. Druitt
Managing Director of Sialon Ceramics Pty. Ltd. and Wallarah Minerals Pty. Ltd.
130 Tall Timbers Rd, Doyalson North, NSW 2262, Australia
Tel. +61 2 4358 4994; Fax. +61 2 4358 1348

Sialon Ceramics ABN: 57 002 988 543; Wallarah Minerals ABN: 77 002 503 399

Email:

office@sialon.com.au

Content

High Temperature Kelvin Probe Application Specification Construction Ancillary Equipment Staff Training		High Temperature Seebeck Probe Application Characterisation and Specification Construction Ancillary Equipment Staff Training

Product Overview

HIGH TEMPERATURE KELVIN PROBE (HTKP)

APPLICATION

Kelvin Probe,

External View

Kelvin Probe,

Internal View

The High-Temperature Kelvin Probe (HTKP) may be applied for the determination work function (WF) and its changes as a function of time. The HTKP is a unique surface sensitive apparatus that may be used for investigation of materials at elevated emperatures and under controlled gas phase environment of atmospheric pressure (it does not require vacuum). The HTKP may also be applied for in situ surface monitoring of materials during their processing. The probe is sensitive in an atomic scale with respect of the outermost surface layer. The probe has a wide range of applications in the following areas:

• Catalysis.
  • Solid-State Chemistry.
    • Solid-State Physics.
      • Metallurgy.
        • Materials Science.

SPECIFICATION
Temperature:		RT - 1200K
Gas environment:		Static/Dynamic
Size:
Height:		1000 mm
Base:		400 x 400 mm
Weight:		21 Kg
Specimen's size:		approx 10 x 10 x 2 mm
Vibration frequency:		30 Hz - 100Hz
Accuracy:		± 0.5 mV

CONSTRUCTION

The probe incorporates the following integral components:

(1) Vibrating system,
(2) Vibrating capacitor, and
(3) Tuning system (Figure 2 and Figure 3)

Figure 2 - High Temperature Kelvin Probe - Internal View (Schematic)

Figure 3 - High Temperature Kelvin Probe - External View (Schematic)

The vibrating capacitor is formed of a specimen located on support and upper reference electrode. The electrode is put into vibrations using piezoceramic element. The distance between the capacitor plates (about 0.1 - 0.2 mm) is tuned using a micrometer attached to the sample support.

A tube-type surface is located in the middle part (at the sample level). Upper and lower water coolers aim at preventing the upper and lower parts against heating. Gas inlet and outlet are connected to a gas flow system. The probe is gas tightened by two fringes. The specimen is located on a support.

A rack allows to remove the lower part of the probe and to replace the specimen. Performance of the probe and its applications were reported in refs 1-3.

ANCILLARY EQUIPMENT

The HTKP and the ancillary equipment are shown, schematically, in Figure 1.

Figure 1 - The High Temperature Kelvin Probe (2000) and Ancillary Equipment

Additional equipment items required for HTKP include:

High Voltage amplifier, voltmeter, frequency generator, integrator, oscilloscope, chart recorder, personal computer, temperature controllers, lock-in amplifier, scanner, gas-low system, and oxygen sensor.

This ancillary equipment is also available from Sialon Ceramics Pty Ltd, upon request.

STAFF TRAINING

Sialon Ceramics Pty Ltd offers staff training on the applications of the HTKP.

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HIGH TEMPERATURE SEEBECK PROBE (HTSP)

APPLICATION

Seebeck Probe, External View

The High Temperature Seebeck Probe (HTSP) is designed to determine the Seebeck coefficient (thermopower) and electrical conductivity of materials (single crystals and polycrystalline specimens) at elevated temperatures (up to 1100°C) and under controlled gas phase environments.

The HTSP has application in the characterization of semi conducting and thermoelectric properties of materials as well as in monitoring the processes related with mass and charge transport kinetics.

The probe has a wide range of applications in the following areas.

• Solid-State Chemistry
  • Solid-State Physics
    • Metallurgy
      • Materials science
        

The probe may be characterized in the following types of materials:

SPECIFICATION
Sample temperature:		RT - 1400 k
Gas environment:		Static/dynamic
Specimen resistance:		Up to 10
Length:		1000 mm
Diameter:		110 mm
Weight:		~ 2.5 Kg.
Sample size:		~ 8 x 8 x 4 mm
Accuracy (S):		± 0.5 µ V/K

CHARACTERISATION

- Catalysts

- Materials for Energy Conversion (electrodes and solid electrolytes)

- Materials for Has Sensing

- Thermoelectric Materials

- Nuclear Materials

- Electronic Materials

CONSTRUCTION

 

	Seebeck Probe, Internal View
	Seebeck Probe, Ancillary Equipment

The HTSP incorporates a probe chamber (including sample holder, micro heaters and thermocouples), and a probe head (including
electrical outlets and printed circuit board)

ANCILLARY EQUIPMENT

For functionality of the HTSP, several ancillary items are required, including personal computer, multimeter, electrometer, scanners, current source, temperature controllers, tube furnace, oxygen sensor, gas flow system and software for data acquisition and processing.

STAFF TRAINING

Sialon Ceramics Pty Ltd offers staff training on the applications of the HTSP.